CVE-2024-45573

HIGH

7.8

Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

CVE Details

CVSS v3.1 Score7.8

SeverityHIGH

CVSS VectorCVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Attack VectorLOCAL

ComplexityLOW

Privileges RequiredLOW

User InteractionNONE

Published2/3/2025

Last Modified2/5/2025

Sourcenvd

Honeypot Sightings0

Affected Products

qualcomm:fastconnect_6700qualcomm:fastconnect_6700_firmwarequalcomm:fastconnect_6900qualcomm:fastconnect_6900_firmwarequalcomm:fastconnect_7800qualcomm:fastconnect_7800_firmwarequalcomm:qcm5430qualcomm:qcm5430_firmwarequalcomm:qcm6490qualcomm:qcm6490_firmwarequalcomm:qcs5430qualcomm:qcs5430_firmwarequalcomm:qcs6490qualcomm:qcs6490_firmwarequalcomm:sc8280xp-abbbqualcomm:sc8280xp-abbb_firmwarequalcomm:sc8380xpqualcomm:sc8380xp_firmwarequalcomm:sdm429wqualcomm:sdm429w_firmwarequalcomm:snapdragon_429_mobilequalcomm:snapdragon_429_mobile_firmwarequalcomm:snapdragon_7c\+_gen_3_computequalcomm:snapdragon_7c\+_gen_3_compute_firmwarequalcomm:video_collaboration_vc3_platformqualcomm:video_collaboration_vc3_platform_firmwarequalcomm:wcd9370qualcomm:wcd9370_firmwarequalcomm:wcd9375qualcomm:wcd9375_firmwarequalcomm:wcd9380qualcomm:wcd9380_firmwarequalcomm:wcd9385qualcomm:wcd9385_firmwarequalcomm:wcn3620qualcomm:wcn3620_firmwarequalcomm:wcn3660bqualcomm:wcn3660b_firmwarequalcomm:wsa8830qualcomm:wsa8830_firmwarequalcomm:wsa8835qualcomm:wsa8835_firmwarequalcomm:wsa8840qualcomm:wsa8840_firmwarequalcomm:wsa8845qualcomm:wsa8845_firmwarequalcomm:wsa8845hqualcomm:wsa8845h_firmware

Weaknesses (CWE)

CWE-823CWE-119

References

https://docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.html(product-security@qualcomm.com)

IOC Correlations

No correlations recorded

This product uses data from the NVD API but is not endorsed or certified by the NVD.